TY - JOUR T1 - Turn-On Characteristics of Polycrystalline Silicon TFT's - Impact of Hydrogenation and Channel Length JO - IEEE Electron Device Letters PY - 1999/01/01 AU - Xu YZ AU - Clough FJ AU - Narayanan EMS AU - Chen Y AU - Milne WI ED - DO - DOI: 10.1109/55.740658 VL - 20 IS - 2 SP - 80 EP - 82 Y2 - 2025/04/29 ER -