TY - CONF T1 - Effect of bismuth flux on the optical and morphological properties of GaAsBi grown by Molecular Beam Epitaxy JO - 2022 IEEE 8th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) UR - http://dx.doi.org/10.1109/icsima55652.2022.9929153 PY - 2022/09/26 AU - Harun F AU - Richards RD AU - David JP ED - DO - DOI: 10.1109/icsima55652.2022.9929153 PB - IEEE Y2 - 2025/04/30 ER -