TY - JOUR T1 - A comparison of avalanche breakdown probabilities in semiconductor materials JO - Journal of Modern Optics UR - http://dx.doi.org/10.1080/09500340410001670848 PY - 2004/01/01 AU - Ng JS AU - Tan CH AU - David JPR ED - DO - DOI: 10.1080/09500340410001670848 PB - Informa UK Limited VL - 51 IS - 9-10 SP - 1315 EP - 1321 Y2 - 2025/04/16 ER -