TY - CONF T1 - Structural analysis of the effects of a combined InAlAs-InGaAs capping layer in 1.3-mu m InAs quantum dots JO - Microscopy of Semiconducting Materials PY - 2005/01/01 AU - Tey CM AU - Cullis AG AU - Liu HY AU - Ross IM AU - Hopkinson M ED - Cullis AG ED - Hutchison JL VL - 107 SP - 263 EP - 266 Y2 - 2025/05/11 ER -