TY - JOUR T1 - Measurement and Characterization Technique for Real-Time Die Temperature Prediction of MOSFET-Based Power Electronics JO - IEEE Transactions on Power Electronics UR - http://eprints.whiterose.ac.uk/90214/ PY - 2015/09/03 AU - Davidson J AU - Stone D AU - Foster M AU - Gladwin D ED - DO - DOI: 10.1109/TPEL.2015.2476557 VL - 31 IS - 6 SP - 4378 EP - 4388 Y2 - 2025/05/01 ER -