@article{article, title = {{Improving test quality using robust unique input/output circuit sequences (UIOCs)}}, publisher = {{Elsevier BV}}, url = {{}}, year = {{2006}}, month = {{1}}, author = {{Guo Q and Hierons RM and Harman M and Derderian K}}, doi = {{10.1016/j.infsof.2005.08.001}}, volume = {{48}}, journal = {{Information and Software Technology}}, issue = {{8}}, pages = {{696-707}}, note = {{Accessed on 2025/04/14}}}