TY - JOUR T1 - Analysis of CMOS-compatible lateral insulated base transistors JO - IEEE Transactions on Electron Devices PY - 1991/01/01 AU - Narayanan EMS AU - Amaratunga GAJ AU - Milne WI AU - Humphrey JI AU - Huang Q ED - DO - DOI: 10.1109/16.85159 PB - Institute of Electrical and Electronics Engineers (IEEE) VL - 38 IS - 7 SP - 1624 EP - 1632 Y2 - 2025/04/29 ER -